Showing 1 - 13 of 13 Results
1.
Critical Issues in Scanning Electron Microscope Metrology: September-October 1994 by Michael T. Postek ISBN: 9780788115523 List Price: $20.00
2.
Nanostructure Science, Metrology, and Technology (Proceedings of Spie) by Peckerar, Martin C., Postek... ISBN: 9780819443472 List Price: $80.00
3.
Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie) by Postek, Michael T., Allgair... ISBN: 9780819472625 List Price: $60.00
4.
New Research in Nanotechnology by Postek, Michael T., Kopansk... ISBN: 9781607411352
5.
Scanning Microscopy 2010 : 17-19 May 2010, Monterey, California, United States by Postek, Michael T., SPIE (S... ISBN: 9780819482174 List Price: $120.00
6.
Instrumentation, Metrology, and Standards for Nanomanufacturing IV : 2-4 August 2010, San Di... by Postek, Michael T., Allgair... ISBN: 9780819482631 List Price: $80.00
7.
Instrumentation, Metrology, and Standards for Nanomanufacturing : 29-30 August 2007, San Die... by Postek, Michael T., Allgair... ISBN: 9780819467966 List Price: $80.00
8.
Instrumentation, Metrology, and Standards for Nanomanufacturing III : 3-5 August 2009, San D... by Postek, Michael T., Allgair... ISBN: 9780819476951 List Price: $80.00
9.
Scanning Microscopy 2009 (Proceedings of Spie) by Postek, Michael T., SPIE (S... ISBN: 9780819476548 List Price: $140.00
10.
Microlithography and Metrology in Micromachining II, Vol. 288 by Postek, Michael T., Friedri... ISBN: 9780819422781 List Price: $70.00
11.
Scanning Microscopies 2015 by Postek, Michael T., Newbury... ISBN: 9781628418460
12.
Integrated Circuit Metrology, Inspection, And Process Control VII by Postek, Michael T. ISBN: 9780819411600 List Price: $105.00